Rok Venturini: Ultra-efficient resistance switching between charge ordered phases in 1T-TaS2 with a single picosecond electrical pulse
Resistance switching between charge ordered phases of the 1T-TaS₂ has shown to be potentially useful for the development of high-speed, energy efficient non-volatile memory devices. While ultrafast switching was previously reported with optical pulses, determination of the intrinsic speed limits of actual devices that are triggered by electrical pulses is technically challenging and hitherto still largely unexplored.
Using an optoelectronic “laboratory-on-a-chip” especially designed for measurements of ultrafast memory switching, we are able to accurately measure the electrical switching parameters with sub-100 fs temporal resolution. A photo-switch is used for ultrashort electrical pulse generation, while its propagation along a coplanar transmission line, and across the memory device, is detected using electro-optical sampling using a purpose-grown highly-resistive electro-optic (Cd,Mn)Te crystal substrate.
We observe non-volatile resistance switching with single 1.9 ps electrical pulses, with a switching energy of 0.47 atto-Joules. This represents a significant advance over existing non-volatile memory device concepts in terms of both parameters. The ground-breaking result suggest that electrical charge manipulation in 1T-TaS2 could become a new technological platform for cryogenic, ultrahigh-speed, energy efficient memory devices.